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Extended defects in semiconductors: electronic properties, device effects and structures
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Cambridge Univ. Press
2007
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1126060 |
| _version_ | 1780914849629339648 |
|---|---|
| author | Holt, D B Yacobi, B G |
| author_facet | Holt, D B Yacobi, B G |
| author_sort | Holt, D B |
| collection | CERN |
| id | cern-1126060 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2007 |
| publisher | Cambridge Univ. Press |
| record_format | invenio |
| spelling | cern-11260602021-04-22T01:45:04Zhttp://cds.cern.ch/record/1126060engHolt, D BYacobi, B GExtended defects in semiconductors: electronic properties, device effects and structuresEngineeringCambridge Univ. Pressoai:cds.cern.ch:11260602007 |
| spellingShingle | Engineering Holt, D B Yacobi, B G Extended defects in semiconductors: electronic properties, device effects and structures |
| title | Extended defects in semiconductors: electronic properties, device effects and structures |
| title_full | Extended defects in semiconductors: electronic properties, device effects and structures |
| title_fullStr | Extended defects in semiconductors: electronic properties, device effects and structures |
| title_full_unstemmed | Extended defects in semiconductors: electronic properties, device effects and structures |
| title_short | Extended defects in semiconductors: electronic properties, device effects and structures |
| title_sort | extended defects in semiconductors: electronic properties, device effects and structures |
| topic | Engineering |
| url | http://cds.cern.ch/record/1126060 |
| work_keys_str_mv | AT holtdb extendeddefectsinsemiconductorselectronicpropertiesdeviceeffectsandstructures AT yacobibg extendeddefectsinsemiconductorselectronicpropertiesdeviceeffectsandstructures |