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Extended defects in semiconductors: electronic properties, device effects and structures

Detalles Bibliográficos
Autores principales:	Holt, D B, Yacobi, B G
Lenguaje:	eng
Publicado:	Cambridge Univ. Press 2007
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/1126060

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