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Developments in integrated circuit testing
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Academic Press
1987
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/113625 |
| _version_ | 1780878721730740224 |
|---|---|
| author | Miller, D M |
| author_facet | Miller, D M |
| author_sort | Miller, D M |
| collection | CERN |
| id | cern-113625 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1987 |
| publisher | Academic Press |
| record_format | invenio |
| spelling | cern-1136252021-04-22T04:49:41Zhttp://cds.cern.ch/record/113625engMiller, D MDevelopments in integrated circuit testingEngineeringAcademic Pressoai:cds.cern.ch:1136251987 |
| spellingShingle | Engineering Miller, D M Developments in integrated circuit testing |
| title | Developments in integrated circuit testing |
| title_full | Developments in integrated circuit testing |
| title_fullStr | Developments in integrated circuit testing |
| title_full_unstemmed | Developments in integrated circuit testing |
| title_short | Developments in integrated circuit testing |
| title_sort | developments in integrated circuit testing |
| topic | Engineering |
| url | http://cds.cern.ch/record/113625 |
| work_keys_str_mv | AT millerdm developmentsinintegratedcircuittesting |