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Digital Integrated Circuits: Analysis and Designelectronic version
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Lenguaje: | eng |
Publicado: |
CRC Press
2003
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1138705 |
_version_ | 1780915495088685056 |
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author | Ayers, John E |
author_facet | Ayers, John E |
author_sort | Ayers, John E |
collection | CERN |
id | cern-1138705 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2003 |
publisher | CRC Press |
record_format | invenio |
spelling | cern-11387052021-04-22T01:43:11Zhttp://cds.cern.ch/record/1138705engAyers, John EDigital Integrated Circuits: Analysis and Designelectronic versionEngineeringCRC Pressoai:cds.cern.ch:11387052003 |
spellingShingle | Engineering Ayers, John E Digital Integrated Circuits: Analysis and Designelectronic version |
title | Digital Integrated Circuits: Analysis and Designelectronic version |
title_full | Digital Integrated Circuits: Analysis and Designelectronic version |
title_fullStr | Digital Integrated Circuits: Analysis and Designelectronic version |
title_full_unstemmed | Digital Integrated Circuits: Analysis and Designelectronic version |
title_short | Digital Integrated Circuits: Analysis and Designelectronic version |
title_sort | digital integrated circuits: analysis and designelectronic version |
topic | Engineering |
url | http://cds.cern.ch/record/1138705 |
work_keys_str_mv | AT ayersjohne digitalintegratedcircuitsanalysisanddesignelectronicversion |