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Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization
Autores principales: | , , , , , , , , , , , |
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Publicado: |
2009
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1156128 |
_version_ | 1780915748196057088 |
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author | Deicher, M Deicher, M Bollmann, J Gerten, R Henry, M Kronenberg, J Al-Qaradawi, I Johnston, K Peaker, A R Thewalt, M Türker, M Wichert, Th Wolf, H |
author_facet | Deicher, M Deicher, M Bollmann, J Gerten, R Henry, M Kronenberg, J Al-Qaradawi, I Johnston, K Peaker, A R Thewalt, M Türker, M Wichert, Th Wolf, H |
author_sort | Deicher, M |
collection | CERN |
id | cern-1156128 |
institution | Organización Europea para la Investigación Nuclear |
publishDate | 2009 |
record_format | invenio |
spelling | cern-11561282019-09-30T06:29:59Zhttp://cds.cern.ch/record/1156128Deicher, MDeicher, MBollmann, JGerten, RHenry, MKronenberg, JAl-Qaradawi, IJohnston, KPeaker, A RThewalt, MTürker, MWichert, ThWolf, HDefects in ZnO, CdTe, and Si: Optical, structural, and electrical characterizationDetectors and Experimental TechniquesCERN-INTC-2009-018INTC-P-265oai:cds.cern.ch:11561282009-01-19 |
spellingShingle | Detectors and Experimental Techniques Deicher, M Deicher, M Bollmann, J Gerten, R Henry, M Kronenberg, J Al-Qaradawi, I Johnston, K Peaker, A R Thewalt, M Türker, M Wichert, Th Wolf, H Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title | Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title_full | Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title_fullStr | Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title_full_unstemmed | Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title_short | Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization |
title_sort | defects in zno, cdte, and si: optical, structural, and electrical characterization |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/1156128 |
work_keys_str_mv | AT deicherm defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT deicherm defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT bollmannj defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT gertenr defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT henrym defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT kronenbergj defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT alqaradawii defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT johnstonk defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT peakerar defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT thewaltm defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT turkerm defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT wichertth defectsinznocdteandsiopticalstructuralandelectricalcharacterization AT wolfh defectsinznocdteandsiopticalstructuralandelectricalcharacterization |