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Defects in ZnO, CdTe, and Si: Optical, structural, and electrical characterization

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Detalles Bibliográficos
Autores principales:	Deicher, M, Bollmann, J, Gerten, R, Henry, M, Kronenberg, J, Al-Qaradawi, I, Johnston, K, Peaker, A R, Thewalt, M, Türker, M, Wichert, Th, Wolf, H
Publicado:	2009
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/1156128

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