Cargando…
Noise Susceptibility Measurements of Front-End Electronics Systems
The conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in ord...
Autores principales: | , , , , , , , |
---|---|
Lenguaje: | eng |
Publicado: |
CERN
2008
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-2008-008.316 http://cds.cern.ch/record/1158650 |
_version_ | 1780915821629931520 |
---|---|
author | Allongue, B Anghinolfi, F Blanchot, G Faccio, F Fuentes, C Michelis, S Orlandi, S Toro, A |
author_facet | Allongue, B Anghinolfi, F Blanchot, G Faccio, F Fuentes, C Michelis, S Orlandi, S Toro, A |
author_sort | Allongue, B |
collection | CERN |
description | The conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in order to achieve the expected system performance. A method to measure the common mode current susceptibility using current probes is presented. The compatibility between power supplies and various front-end systems is explored. |
id | cern-1158650 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2008 |
publisher | CERN |
record_format | invenio |
spelling | cern-11586502019-09-30T06:29:59Zdoi:10.5170/CERN-2008-008.316http://cds.cern.ch/record/1158650engAllongue, BAnghinolfi, FBlanchot, GFaccio, FFuentes, CMichelis, SOrlandi, SToro, ANoise Susceptibility Measurements of Front-End Electronics SystemsDetectors and Experimental TechniquesThe conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in order to achieve the expected system performance. A method to measure the common mode current susceptibility using current probes is presented. The compatibility between power supplies and various front-end systems is explored.CERNoai:cds.cern.ch:11586502008 |
spellingShingle | Detectors and Experimental Techniques Allongue, B Anghinolfi, F Blanchot, G Faccio, F Fuentes, C Michelis, S Orlandi, S Toro, A Noise Susceptibility Measurements of Front-End Electronics Systems |
title | Noise Susceptibility Measurements of Front-End Electronics Systems |
title_full | Noise Susceptibility Measurements of Front-End Electronics Systems |
title_fullStr | Noise Susceptibility Measurements of Front-End Electronics Systems |
title_full_unstemmed | Noise Susceptibility Measurements of Front-End Electronics Systems |
title_short | Noise Susceptibility Measurements of Front-End Electronics Systems |
title_sort | noise susceptibility measurements of front-end electronics systems |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.5170/CERN-2008-008.316 http://cds.cern.ch/record/1158650 |
work_keys_str_mv | AT allongueb noisesusceptibilitymeasurementsoffrontendelectronicssystems AT anghinolfif noisesusceptibilitymeasurementsoffrontendelectronicssystems AT blanchotg noisesusceptibilitymeasurementsoffrontendelectronicssystems AT facciof noisesusceptibilitymeasurementsoffrontendelectronicssystems AT fuentesc noisesusceptibilitymeasurementsoffrontendelectronicssystems AT micheliss noisesusceptibilitymeasurementsoffrontendelectronicssystems AT orlandis noisesusceptibilitymeasurementsoffrontendelectronicssystems AT toroa noisesusceptibilitymeasurementsoffrontendelectronicssystems |