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Noise Susceptibility Measurements of Front-End Electronics Systems

The conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in ord...

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Detalles Bibliográficos
Autores principales: Allongue, B, Anghinolfi, F, Blanchot, G, Faccio, F, Fuentes, C, Michelis, S, Orlandi, S, Toro, A
Lenguaje:eng
Publicado: CERN 2008
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2008-008.316
http://cds.cern.ch/record/1158650
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author Allongue, B
Anghinolfi, F
Blanchot, G
Faccio, F
Fuentes, C
Michelis, S
Orlandi, S
Toro, A
author_facet Allongue, B
Anghinolfi, F
Blanchot, G
Faccio, F
Fuentes, C
Michelis, S
Orlandi, S
Toro, A
author_sort Allongue, B
collection CERN
description The conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in order to achieve the expected system performance. A method to measure the common mode current susceptibility using current probes is presented. The compatibility between power supplies and various front-end systems is explored.
id cern-1158650
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2008
publisher CERN
record_format invenio
spelling cern-11586502019-09-30T06:29:59Zdoi:10.5170/CERN-2008-008.316http://cds.cern.ch/record/1158650engAllongue, BAnghinolfi, FBlanchot, GFaccio, FFuentes, CMichelis, SOrlandi, SToro, ANoise Susceptibility Measurements of Front-End Electronics SystemsDetectors and Experimental TechniquesThe conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in order to achieve the expected system performance. A method to measure the common mode current susceptibility using current probes is presented. The compatibility between power supplies and various front-end systems is explored.CERNoai:cds.cern.ch:11586502008
spellingShingle Detectors and Experimental Techniques
Allongue, B
Anghinolfi, F
Blanchot, G
Faccio, F
Fuentes, C
Michelis, S
Orlandi, S
Toro, A
Noise Susceptibility Measurements of Front-End Electronics Systems
title Noise Susceptibility Measurements of Front-End Electronics Systems
title_full Noise Susceptibility Measurements of Front-End Electronics Systems
title_fullStr Noise Susceptibility Measurements of Front-End Electronics Systems
title_full_unstemmed Noise Susceptibility Measurements of Front-End Electronics Systems
title_short Noise Susceptibility Measurements of Front-End Electronics Systems
title_sort noise susceptibility measurements of front-end electronics systems
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2008-008.316
http://cds.cern.ch/record/1158650
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AT fuentesc noisesusceptibilitymeasurementsoffrontendelectronicssystems
AT micheliss noisesusceptibilitymeasurementsoffrontendelectronicssystems
AT orlandis noisesusceptibilitymeasurementsoffrontendelectronicssystems
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