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High-Resolution Time-to-Digital Converter in Field Programmable Gate Array

Two high-resolution time-interval measuring systems implemented in a SRAM-based FPGA device are presented. The two methods ought to be used for time interpolation within the system clock cycle. We designed and built a PCB hosting a Virtex-5 Xilinx FPGA. We exploited high stability oscillators to tes...

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Detalles Bibliográficos
Autores principales: Aloisio, A, Branchini, P, Cicalese, R, Giordano, R, Izzo, V, Loffredo, S, Lomoro, R
Lenguaje:eng
Publicado: CERN 2008
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2008-008.383
http://cds.cern.ch/record/1158663
Descripción
Sumario:Two high-resolution time-interval measuring systems implemented in a SRAM-based FPGA device are presented. The two methods ought to be used for time interpolation within the system clock cycle. We designed and built a PCB hosting a Virtex-5 Xilinx FPGA. We exploited high stability oscillators to test the two different architectures. In the first method, dedicated carry lines are used to perform fine time measurement, while in the second one a differential tapped delay line is used. In this paper we compare the two architectures and show their performance in terms of stability and resolution.