Design and measurements of SEU tolerant latches

Latches based on the Dual Interlocked storage Cell or DICE are very tolerant to Single Event Upsets (SEU). However, for highly scaled processes where the sizes continue to decrease, the data in this latch can be corrupted by an SEU due to charge sharing between adjacent nodes. Some layout considerat...

Descripción completa

Detalles Bibliográficos
Autores principales: Menouni, M, Arutinov, D, Barbero, M, Beccherle, R, Breugnon, P, Ely, R, Fougeron, D, García-Sciveres, M, Gnani, D, Hemperek, T, Karagounis, M, Kluit, R, Mekkaoui, A, Rozanov, A, Schipper, J-D
Lenguaje:eng
Publicado: CERN 2008
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2008-008.402
http://cds.cern.ch/record/1158670

Internet

https://dx.doi.org/10.5170/CERN-2008-008.402
http://cds.cern.ch/record/1158670

Ejemplares similares