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Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
In this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CM...
Autores principales: | , , , |
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Lenguaje: | eng |
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CERN
2008
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-2008-008.486 http://cds.cern.ch/record/1159560 |
_version_ | 1780915848720941056 |
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author | Noulis, T Fikos, G Siskos, S Sarrabayrouse, G |
author_facet | Noulis, T Fikos, G Siskos, S Sarrabayrouse, G |
author_sort | Noulis, T |
collection | CERN |
description | In this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CMOS process by Austria MicroSystems (AMS). Another couple of complementary structures consisting of a noise-optimised input npn with a pMOSFET cascode, and the respective structure having a pMOS as input device, were developed in a 0.35 μm SiGe BiCMOS process (AMS). The structures' comparison is performed through simulation, after careful selection of the parameters that remain constant in all four variations. |
id | cern-1159560 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2008 |
publisher | CERN |
record_format | invenio |
spelling | cern-11595602019-09-30T06:29:59Zdoi:10.5170/CERN-2008-008.486http://cds.cern.ch/record/1159560engNoulis, TFikos, GSiskos, SSarrabayrouse, GNoise Analysis of Radiation Detector Charge Sensitive Amplifier ArchitecturesDetectors and Experimental TechniquesIn this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CMOS process by Austria MicroSystems (AMS). Another couple of complementary structures consisting of a noise-optimised input npn with a pMOSFET cascode, and the respective structure having a pMOS as input device, were developed in a 0.35 μm SiGe BiCMOS process (AMS). The structures' comparison is performed through simulation, after careful selection of the parameters that remain constant in all four variations.CERNoai:cds.cern.ch:11595602008 |
spellingShingle | Detectors and Experimental Techniques Noulis, T Fikos, G Siskos, S Sarrabayrouse, G Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title | Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title_full | Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title_fullStr | Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title_full_unstemmed | Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title_short | Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures |
title_sort | noise analysis of radiation detector charge sensitive amplifier architectures |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.5170/CERN-2008-008.486 http://cds.cern.ch/record/1159560 |
work_keys_str_mv | AT noulist noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures AT fikosg noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures AT siskoss noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures AT sarrabayrouseg noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures |