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Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures

In this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CM...

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Detalles Bibliográficos
Autores principales: Noulis, T, Fikos, G, Siskos, S, Sarrabayrouse, G
Lenguaje:eng
Publicado: CERN 2008
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2008-008.486
http://cds.cern.ch/record/1159560
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author Noulis, T
Fikos, G
Siskos, S
Sarrabayrouse, G
author_facet Noulis, T
Fikos, G
Siskos, S
Sarrabayrouse, G
author_sort Noulis, T
collection CERN
description In this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CMOS process by Austria MicroSystems (AMS). Another couple of complementary structures consisting of a noise-optimised input npn with a pMOSFET cascode, and the respective structure having a pMOS as input device, were developed in a 0.35 μm SiGe BiCMOS process (AMS). The structures' comparison is performed through simulation, after careful selection of the parameters that remain constant in all four variations.
id cern-1159560
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2008
publisher CERN
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spelling cern-11595602019-09-30T06:29:59Zdoi:10.5170/CERN-2008-008.486http://cds.cern.ch/record/1159560engNoulis, TFikos, GSiskos, SSarrabayrouse, GNoise Analysis of Radiation Detector Charge Sensitive Amplifier ArchitecturesDetectors and Experimental TechniquesIn this work, a detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CMOS process by Austria MicroSystems (AMS). Another couple of complementary structures consisting of a noise-optimised input npn with a pMOSFET cascode, and the respective structure having a pMOS as input device, were developed in a 0.35 μm SiGe BiCMOS process (AMS). The structures' comparison is performed through simulation, after careful selection of the parameters that remain constant in all four variations.CERNoai:cds.cern.ch:11595602008
spellingShingle Detectors and Experimental Techniques
Noulis, T
Fikos, G
Siskos, S
Sarrabayrouse, G
Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title_full Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title_fullStr Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title_full_unstemmed Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title_short Noise Analysis of Radiation Detector Charge Sensitive Amplifier Architectures
title_sort noise analysis of radiation detector charge sensitive amplifier architectures
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2008-008.486
http://cds.cern.ch/record/1159560
work_keys_str_mv AT noulist noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures
AT fikosg noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures
AT siskoss noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures
AT sarrabayrouseg noiseanalysisofradiationdetectorchargesensitiveamplifierarchitectures