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Microelectronics failure analysis: lecture series
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Soft Test
2007
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1165092 |
| _version_ | 1780916002828058624 |
|---|---|
| author | Soft Test. New Smyrna Beach, FL, USA New Mexico Univ. Albuquerque, NM, USA |
| author_facet | Soft Test. New Smyrna Beach, FL, USA New Mexico Univ. Albuquerque, NM, USA |
| author_sort | Soft Test. New Smyrna Beach, FL, USA |
| collection | CERN |
| id | cern-1165092 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2007 |
| publisher | Soft Test |
| record_format | invenio |
| spelling | cern-11650922021-04-22T01:38:26Zhttp://cds.cern.ch/record/1165092engSoft Test. New Smyrna Beach, FL, USANew Mexico Univ. Albuquerque, NM, USAMicroelectronics failure analysis: lecture seriesEngineeringSoft Testoai:cds.cern.ch:11650922007 |
| spellingShingle | Engineering Soft Test. New Smyrna Beach, FL, USA New Mexico Univ. Albuquerque, NM, USA Microelectronics failure analysis: lecture series |
| title | Microelectronics failure analysis: lecture series |
| title_full | Microelectronics failure analysis: lecture series |
| title_fullStr | Microelectronics failure analysis: lecture series |
| title_full_unstemmed | Microelectronics failure analysis: lecture series |
| title_short | Microelectronics failure analysis: lecture series |
| title_sort | microelectronics failure analysis: lecture series |
| topic | Engineering |
| url | http://cds.cern.ch/record/1165092 |
| work_keys_str_mv | AT softtestnewsmyrnabeachflusa microelectronicsfailureanalysislectureseries AT newmexicounivalbuquerquenmusa microelectronicsfailureanalysislectureseries |