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RF and microwave modeling and measurement techniques for field effect transistors

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce de...

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Detalles Bibliográficos
Autor principal: Gao, Jianjun
Lenguaje:eng
Publicado: SciTec 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1187613
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author Gao, Jianjun
author_facet Gao, Jianjun
author_sort Gao, Jianjun
collection CERN
description This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
publisher SciTec
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spelling cern-11876132021-04-22T01:35:06Zhttp://cds.cern.ch/record/1187613engGao, JianjunRF and microwave modeling and measurement techniques for field effect transistorsEngineeringThis book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such SciTecoai:cds.cern.ch:11876132010
spellingShingle Engineering
Gao, Jianjun
RF and microwave modeling and measurement techniques for field effect transistors
title RF and microwave modeling and measurement techniques for field effect transistors
title_full RF and microwave modeling and measurement techniques for field effect transistors
title_fullStr RF and microwave modeling and measurement techniques for field effect transistors
title_full_unstemmed RF and microwave modeling and measurement techniques for field effect transistors
title_short RF and microwave modeling and measurement techniques for field effect transistors
title_sort rf and microwave modeling and measurement techniques for field effect transistors
topic Engineering
url http://cds.cern.ch/record/1187613
work_keys_str_mv AT gaojianjun rfandmicrowavemodelingandmeasurementtechniquesforfieldeffecttransistors