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Radiation hardness of CMS pixel barrel modules

Pixel detectors are used in the innermost part of multi purpose experiments at LHC and are therefore exposed to the highest fluences of ionizing radiation, which in this part of the detectors consists mainly of charged pions. The radiation hardness of the detectors has thoroughly been tested up to t...

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Autores principales: Rohe, T., Bean, A., Erdmann, W., Kastli, H.-C., Khalatyan, S., Meier, B., Radicci, V., Sibille, J.
Lenguaje:eng
Publicado: 2009
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2010.03.157
http://cds.cern.ch/record/1204544
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author Rohe, T.
Bean, A.
Erdmann, W.
Kastli, H.-C.
Khalatyan, S.
Meier, B.
Radicci, V.
Sibille, J.
author_facet Rohe, T.
Bean, A.
Erdmann, W.
Kastli, H.-C.
Khalatyan, S.
Meier, B.
Radicci, V.
Sibille, J.
author_sort Rohe, T.
collection CERN
description Pixel detectors are used in the innermost part of multi purpose experiments at LHC and are therefore exposed to the highest fluences of ionizing radiation, which in this part of the detectors consists mainly of charged pions. The radiation hardness of the detectors has thoroughly been tested up to the fluences expected at the LHC. In case of an LHC upgrade, the fluence will be much higher and it is not yet clear up to which radii the present pixel technology can be used. In order establish such a limit, small pixel barrel sensors have been bump-bonded to CMS pixel read out chips. These samples have been irradiated with positive pions at PSI up to 6E14 Neq/cm2 and with 21 GeV protons at CERN up to 4E15 Neq/cm2. The effect of the radiation on both the sensor and the readout chip has been tested. The signal collection of the sensors and the analogue performance of the readout chip as a function of the irradiation fluence will be presented.
id cern-1204544
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2009
record_format invenio
spelling cern-12045442023-03-12T05:10:25Zdoi:10.1016/j.nima.2010.03.157http://cds.cern.ch/record/1204544engRohe, T.Bean, A.Erdmann, W.Kastli, H.-C.Khalatyan, S.Meier, B.Radicci, V.Sibille, J.Radiation hardness of CMS pixel barrel modulesDetectors and Experimental TechniquesDetectors and Experimental TechniquesPixel detectors are used in the innermost part of multi purpose experiments at LHC and are therefore exposed to the highest fluences of ionizing radiation, which in this part of the detectors consists mainly of charged pions. The radiation hardness of the detectors has thoroughly been tested up to the fluences expected at the LHC. In case of an LHC upgrade, the fluence will be much higher and it is not yet clear up to which radii the present pixel technology can be used. In order establish such a limit, small pixel barrel sensors have been bump-bonded to CMS pixel read out chips. These samples have been irradiated with positive pions at PSI up to 6E14 Neq/cm2 and with 21 GeV protons at CERN up to 4E15 Neq/cm2. The effect of the radiation on both the sensor and the readout chip has been tested. The signal collection of the sensors and the analogue performance of the readout chip as a function of the irradiation fluence will be presented.Pixel detectors are used in the innermost part of the multi purpose experiments at LHC and are therefore exposed to the highest fluences of ionising radiation, which in this part of the detectors consists mainly of charged pions. The radiation hardness of all detector components has thoroughly been tested up to the fluences expected at the LHC. In case of an LHC upgrade, the fluence will be much higher and it is not yet clear how long the present pixel modules will stay operative in such a harsh environment. The aim of this study was to establish such a limit as a benchmark for other possible detector concepts considered for the upgrade. As the sensors and the readout chip are the parts most sensitive to radiation damage, samples consisting of a small pixel sensor bump-bonded to a CMS-readout chip (PSI46V2.1) have been irradiated with positive 200 MeV pions at PSI up to 6E14 Neq and with 21 GeV protons at CERN up to 5E15 Neq. After irradiation the response of the system to beta particles from a Sr-90 source was measured to characterise the charge collection efficiency of the sensor. Radiation induced changes in the readout chip were also measured. The results show that the present pixel modules can be expected to be still operational after a fluence of 2.8E15 Neq. Samples irradiated up to 5E15 Neq still see the beta particles. However, further tests are needed to confirm whether a stable operation with high particle detection efficiency is possible after such a high fluence.arXiv:1001.0666CMS-CR-2009-198oai:cds.cern.ch:12045442009-07-01
spellingShingle Detectors and Experimental Techniques
Detectors and Experimental Techniques
Rohe, T.
Bean, A.
Erdmann, W.
Kastli, H.-C.
Khalatyan, S.
Meier, B.
Radicci, V.
Sibille, J.
Radiation hardness of CMS pixel barrel modules
title Radiation hardness of CMS pixel barrel modules
title_full Radiation hardness of CMS pixel barrel modules
title_fullStr Radiation hardness of CMS pixel barrel modules
title_full_unstemmed Radiation hardness of CMS pixel barrel modules
title_short Radiation hardness of CMS pixel barrel modules
title_sort radiation hardness of cms pixel barrel modules
topic Detectors and Experimental Techniques
Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2010.03.157
http://cds.cern.ch/record/1204544
work_keys_str_mv AT rohet radiationhardnessofcmspixelbarrelmodules
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AT erdmannw radiationhardnessofcmspixelbarrelmodules
AT kastlihc radiationhardnessofcmspixelbarrelmodules
AT khalatyans radiationhardnessofcmspixelbarrelmodules
AT meierb radiationhardnessofcmspixelbarrelmodules
AT radicciv radiationhardnessofcmspixelbarrelmodules
AT sibillej radiationhardnessofcmspixelbarrelmodules