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A Novel Technique for Mitigating Multipactor by Means of Magnetic Surface Roughness
Multipactor phenomena which are closely linked to the SEY (secondary electron yield)can be mitigated by many different methods including groves in the metal surface as well as using electric or magnetic bias fields. However frequently the application of global magnetic or electric bias field is not...
Autores principales: | , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2009
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1212997 |