Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout

A test system developed for ABCN-25 for ATLAS Inner Detector Upgrade is presented. The system is based on commercial off the shelf DAQ components by National Instruments and foreseen to aid in chip characterization and hybrid/module development complementing full custom VME based setups. The key differences from the point of software development are presented, together with guidelines for developing high performance LabVIEW code. Some real-world benchmarks will also be presented together with chip test results. The presented tests show good agreement of test results between the test setups used in different sites, as well as agreement with design specifications of the chip.