Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout

A test system developed for ABCN-25 for ATLAS Inner Detector Upgrade is presented. The system is based on commercial off the shelf DAQ components by National Instruments and foreseen to aid in chip characterization and hybrid/module development complementing full custom VME based setups. The key dif...

Descripción completa

Detalles Bibliográficos
Autores principales: Dwuznik, M, Gonzalez-Sevilla, S
Lenguaje:eng
Publicado: CERN 2009
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2009-006.139
http://cds.cern.ch/record/1234883
_version_ 1780918528006684672
author Dwuznik, M
Gonzalez-Sevilla, S
author_facet Dwuznik, M
Gonzalez-Sevilla, S
author_sort Dwuznik, M
collection CERN
description A test system developed for ABCN-25 for ATLAS Inner Detector Upgrade is presented. The system is based on commercial off the shelf DAQ components by National Instruments and foreseen to aid in chip characterization and hybrid/module development complementing full custom VME based setups. The key differences from the point of software development are presented, together with guidelines for developing high performance LabVIEW code. Some real-world benchmarks will also be presented together with chip test results. The presented tests show good agreement of test results between the test setups used in different sites, as well as agreement with design specifications of the chip.
id cern-1234883
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2009
publisher CERN
record_format invenio
spelling cern-12348832019-09-30T06:29:59Zdoi:10.5170/CERN-2009-006.139http://cds.cern.ch/record/1234883engDwuznik, MGonzalez-Sevilla, SReplacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readoutDetectors and Experimental TechniquesA test system developed for ABCN-25 for ATLAS Inner Detector Upgrade is presented. The system is based on commercial off the shelf DAQ components by National Instruments and foreseen to aid in chip characterization and hybrid/module development complementing full custom VME based setups. The key differences from the point of software development are presented, together with guidelines for developing high performance LabVIEW code. Some real-world benchmarks will also be presented together with chip test results. The presented tests show good agreement of test results between the test setups used in different sites, as well as agreement with design specifications of the chip.CERNoai:cds.cern.ch:12348832009
spellingShingle Detectors and Experimental Techniques
Dwuznik, M
Gonzalez-Sevilla, S
Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title_full Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title_fullStr Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title_full_unstemmed Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title_short Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
title_sort replacing full custom daq test system by cots daq components on example of atlas sct readout
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2009-006.139
http://cds.cern.ch/record/1234883
work_keys_str_mv AT dwuznikm replacingfullcustomdaqtestsystembycotsdaqcomponentsonexampleofatlassctreadout
AT gonzalezsevillas replacingfullcustomdaqtestsystembycotsdaqcomponentsonexampleofatlassctreadout

Ejemplares similares