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Replacing full custom DAQ test system by COTS DAQ components on example of ATLAS SCT readout
A test system developed for ABCN-25 for ATLAS Inner Detector Upgrade is presented. The system is based on commercial off the shelf DAQ components by National Instruments and foreseen to aid in chip characterization and hybrid/module development complementing full custom VME based setups. The key dif...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
CERN
2009
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| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2009-006.139 http://cds.cern.ch/record/1234883 |