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Measurement of Radiation Damage to 130nm Hybrid Pixel Detector Readout Chips

We present the first measurements of the performance of the Medipix3 hybrid pixel readout chip after exposure to significant x-ray flux. Specifically the changes in performance of the mixed mode pixel architecture, the digital periphery, digital to analogue converters and the e-fuse technology were...

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Detalles Bibliográficos
Autores principales: Plackett, R, Llopart, X, Ballabriga, R, Campbell, M, Tlustos, L, Wong, W
Lenguaje:eng
Publicado: CERN 2009
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2009-006.157
http://cds.cern.ch/record/1234886
Descripción
Sumario:We present the first measurements of the performance of the Medipix3 hybrid pixel readout chip after exposure to significant x-ray flux. Specifically the changes in performance of the mixed mode pixel architecture, the digital periphery, digital to analogue converters and the e-fuse technology were characterised. A high intensity, calibrated x- ray source was used to incrementally irradiate the separate regions of the detector whilst it was powered. This is the first total ionizing dose study of a large area pixel detector fabricated using the 130nm CMOS technology.