FPGA-based Bit-Error-Rate Tester for SEU-hardened Optical Links

The next generation of optical links for future High-Energy Physics experiments will require components qualified for use in radiation-hard environments. To cope with radiation induced single-event upsets, the physical layer protocol will include Forward Error Correction (FEC). Bit-Error-Rate (BER)...

Descripción completa

Detalles Bibliográficos
Autores principales: Detraz, S, Silva, S, Moreira, P, Papadopoulos, S, Papakonstantinou, I, Seif El Nasr, S, Sigaud, C, Soos, C, Stejskal, P, Troska, J, Versmissen, H
Lenguaje:eng
Publicado: CERN 2009
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.5170/CERN-2009-006.636
http://cds.cern.ch/record/1236362

Ejemplares similares

Ejemplares similares