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Semi-automatic analysis of electron micrographs and diffraction patterns
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
1980
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/124213 |
_version_ | 1780879253602041856 |
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author | English, C Q Titchmarsh, J M |
author_facet | English, C Q Titchmarsh, J M |
author_sort | English, C Q |
collection | CERN |
id | cern-124213 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1980 |
record_format | invenio |
spelling | cern-1242132019-09-30T06:29:59Zhttp://cds.cern.ch/record/124213engEnglish, C QTitchmarsh, J MSemi-automatic analysis of electron micrographs and diffraction patternsDetectors and Experimental TechniquesAERE-R-9673oai:cds.cern.ch:1242131980 |
spellingShingle | Detectors and Experimental Techniques English, C Q Titchmarsh, J M Semi-automatic analysis of electron micrographs and diffraction patterns |
title | Semi-automatic analysis of electron micrographs and diffraction patterns |
title_full | Semi-automatic analysis of electron micrographs and diffraction patterns |
title_fullStr | Semi-automatic analysis of electron micrographs and diffraction patterns |
title_full_unstemmed | Semi-automatic analysis of electron micrographs and diffraction patterns |
title_short | Semi-automatic analysis of electron micrographs and diffraction patterns |
title_sort | semi-automatic analysis of electron micrographs and diffraction patterns |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/124213 |
work_keys_str_mv | AT englishcq semiautomaticanalysisofelectronmicrographsanddiffractionpatterns AT titchmarshjm semiautomaticanalysisofelectronmicrographsanddiffractionpatterns |