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Semi-automatic analysis of electron micrographs and diffraction patterns

Detalles Bibliográficos
Autores principales: English, C Q, Titchmarsh, J M
Lenguaje:eng
Publicado: 1980
Materias:
Acceso en línea:http://cds.cern.ch/record/124213
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author English, C Q
Titchmarsh, J M
author_facet English, C Q
Titchmarsh, J M
author_sort English, C Q
collection CERN
id cern-124213
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1980
record_format invenio
spelling cern-1242132019-09-30T06:29:59Zhttp://cds.cern.ch/record/124213engEnglish, C QTitchmarsh, J MSemi-automatic analysis of electron micrographs and diffraction patternsDetectors and Experimental TechniquesAERE-R-9673oai:cds.cern.ch:1242131980
spellingShingle Detectors and Experimental Techniques
English, C Q
Titchmarsh, J M
Semi-automatic analysis of electron micrographs and diffraction patterns
title Semi-automatic analysis of electron micrographs and diffraction patterns
title_full Semi-automatic analysis of electron micrographs and diffraction patterns
title_fullStr Semi-automatic analysis of electron micrographs and diffraction patterns
title_full_unstemmed Semi-automatic analysis of electron micrographs and diffraction patterns
title_short Semi-automatic analysis of electron micrographs and diffraction patterns
title_sort semi-automatic analysis of electron micrographs and diffraction patterns
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/124213
work_keys_str_mv AT englishcq semiautomaticanalysisofelectronmicrographsanddiffractionpatterns
AT titchmarshjm semiautomaticanalysisofelectronmicrographsanddiffractionpatterns