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Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the ALICE experiment
Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the ALICE experiment irradiation test results have been used to predict the single event upset rate expected during operation in the ALICE experiment. Due to the number of FPGAs utilized in the TPC front-en...
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| Lenguaje: | eng |
| Publicado: |
Bergen U.
2009
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| Acceso en línea: | http://cds.cern.ch/record/1244467 |