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Recombination: An important effect in multigap resistive plate chambers

We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches...

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Detalles Bibliográficos
Autores principales: Doroud, K, Afarideh, H, Hatzifotiadou, D, Rahighi, J, Williams, M C S, Zichichi, A
Lenguaje:eng
Publicado: 2009
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2009.09.055
http://cds.cern.ch/record/1262161
Descripción
Sumario:We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches. However, the total charge generated by the simulation program is much too large and is in conflict with our data. Our data indicate that nearly 100% of the negative ions recombine with the positive ions. The recombination effect dramatically reduces the amount of charge in the gas gap: a very important feature for MRPC technology especially for the rate capability.