Recombination: An important effect in multigap resistive plate chambers

We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches...

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Detalles Bibliográficos
Autores principales: Doroud, K, Afarideh, H, Hatzifotiadou, D, Rahighi, J, Williams, M C S, Zichichi, A
Lenguaje:eng
Publicado: 2009
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2009.09.055
http://cds.cern.ch/record/1262161
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author Doroud, K
Afarideh, H
Hatzifotiadou, D
Rahighi, J
Williams, M C S
Zichichi, A
author_facet Doroud, K
Afarideh, H
Hatzifotiadou, D
Rahighi, J
Williams, M C S
Zichichi, A
author_sort Doroud, K
collection CERN
description We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches. However, the total charge generated by the simulation program is much too large and is in conflict with our data. Our data indicate that nearly 100% of the negative ions recombine with the positive ions. The recombination effect dramatically reduces the amount of charge in the gas gap: a very important feature for MRPC technology especially for the rate capability.
id cern-1262161
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2009
record_format invenio
spelling cern-12621612019-09-30T06:29:59Zdoi:10.1016/j.nima.2009.09.055http://cds.cern.ch/record/1262161engDoroud, KAfarideh, HHatzifotiadou, DRahighi, JWilliams, M C SZichichi, ARecombination: An important effect in multigap resistive plate chambersDetectors and Experimental TechniquesWe have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches. However, the total charge generated by the simulation program is much too large and is in conflict with our data. Our data indicate that nearly 100% of the negative ions recombine with the positive ions. The recombination effect dramatically reduces the amount of charge in the gas gap: a very important feature for MRPC technology especially for the rate capability.oai:cds.cern.ch:12621612009
spellingShingle Detectors and Experimental Techniques
Doroud, K
Afarideh, H
Hatzifotiadou, D
Rahighi, J
Williams, M C S
Zichichi, A
Recombination: An important effect in multigap resistive plate chambers
title Recombination: An important effect in multigap resistive plate chambers
title_full Recombination: An important effect in multigap resistive plate chambers
title_fullStr Recombination: An important effect in multigap resistive plate chambers
title_full_unstemmed Recombination: An important effect in multigap resistive plate chambers
title_short Recombination: An important effect in multigap resistive plate chambers
title_sort recombination: an important effect in multigap resistive plate chambers
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2009.09.055
http://cds.cern.ch/record/1262161
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AT hatzifotiadoud recombinationanimportanteffectinmultigapresistiveplatechambers
AT rahighij recombinationanimportanteffectinmultigapresistiveplatechambers
AT williamsmcs recombinationanimportanteffectinmultigapresistiveplatechambers
AT zichichia recombinationanimportanteffectinmultigapresistiveplatechambers

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