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2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop

Detalles Bibliográficos
Autor principal: Ron Keyser, ORTEC
Lenguaje:eng
Publicado: IEEE 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1263247
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author Ron Keyser, ORTEC
author_facet Ron Keyser, ORTEC
author_sort Ron Keyser, ORTEC
collection CERN
id cern-1263247
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
publisher IEEE
record_format invenio
spelling cern-12632472021-07-30T13:14:23Zhttp://cds.cern.ch/record/1263247engRon Keyser, ORTEC2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors WorkshopDetectors and Experimental TechniquesIEEEoai:cds.cern.ch:12632472010
spellingShingle Detectors and Experimental Techniques
Ron Keyser, ORTEC
2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title_full 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title_fullStr 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title_full_unstemmed 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title_short 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop
title_sort 2010 ieee nuclear science symposium, medical imaging conference, and room temperature semiconductor detectors workshop
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1263247
work_keys_str_mv AT ronkeyserortec 2010ieeenuclearsciencesymposiummedicalimagingconferenceandroomtemperaturesemiconductordetectorsworkshop