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7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices

Detalles Bibliográficos
Autores principales: Borchi, E, Bruzzi, M, Menichelli, D, Pace, E
Lenguaje:eng
Publicado: 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1275084
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author Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
author_facet Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
author_sort Borchi, E
collection CERN
id cern-1275084
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
record_format invenio
spelling cern-12750842021-07-30T13:13:45Zhttp://cds.cern.ch/record/1275084engBorchi, EBruzzi, MMenichelli, DPace, E7th International Conference on Radiation Effects on Semiconductor materials, Detectors and DevicesDetectors and Experimental Techniquesoai:cds.cern.ch:12750842010
spellingShingle Detectors and Experimental Techniques
Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title 7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title_full 7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title_fullStr 7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title_full_unstemmed 7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title_short 7th International Conference on Radiation Effects on Semiconductor materials, Detectors and Devices
title_sort 7th international conference on radiation effects on semiconductor materials, detectors and devices
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1275084
work_keys_str_mv AT borchie 7thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT bruzzim 7thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT menichellid 7thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT pacee 7thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices