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Localization of transverse impedance sources in the SPS using HEADTAIL macroparticle simulations
In accelerators, impedances are one of the main contributors to instability phenomena that lead to particle losses and beam quality deterioration. For this reason these machines are continuously monitored and the global (whole machine) and local (single element) amount of impedance is evaluated. In...
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| Lenguaje: | eng |
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Rome U.
2010
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| Acceso en línea: | http://cds.cern.ch/record/1311139 |