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Transmission Electron Microscopy: Physics of Image Formation

Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for eval...

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Detalles Bibliográficos
Autores principales: Kohl, Helmut, Reimer, Ludwig
Lenguaje:eng
Publicado: Springer 2008
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1007/978-0-387-40093-8
http://cds.cern.ch/record/1338648
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author Kohl, Helmut
Reimer, Ludwig
author_facet Kohl, Helmut
Reimer, Ludwig
author_sort Kohl, Helmut
collection CERN
description Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.
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spelling cern-13386482021-04-22T01:05:42Zdoi:10.1007/978-0-387-40093-8http://cds.cern.ch/record/1338648engKohl, HelmutReimer, LudwigTransmission Electron Microscopy: Physics of Image FormationXXTransmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.Springeroai:cds.cern.ch:13386482008
spellingShingle XX
Kohl, Helmut
Reimer, Ludwig
Transmission Electron Microscopy: Physics of Image Formation
title Transmission Electron Microscopy: Physics of Image Formation
title_full Transmission Electron Microscopy: Physics of Image Formation
title_fullStr Transmission Electron Microscopy: Physics of Image Formation
title_full_unstemmed Transmission Electron Microscopy: Physics of Image Formation
title_short Transmission Electron Microscopy: Physics of Image Formation
title_sort transmission electron microscopy: physics of image formation
topic XX
url https://dx.doi.org/10.1007/978-0-387-40093-8
http://cds.cern.ch/record/1338648
work_keys_str_mv AT kohlhelmut transmissionelectronmicroscopyphysicsofimageformation
AT reimerludwig transmissionelectronmicroscopyphysicsofimageformation