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10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

The primary goal of the Conference is to review the present status of the Semiconductor Detector apparatuses in the field of High Energy or Astroparticle Physics. In both cases the requests on the detector systems are very demanding: very large instrumented surface, radiation hardness and high relia...

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Autor principal: Collective
Lenguaje:eng
Publicado: SISSA 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1341243
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author Collective
author_facet Collective
author_sort Collective
collection CERN
description The primary goal of the Conference is to review the present status of the Semiconductor Detector apparatuses in the field of High Energy or Astroparticle Physics. In both cases the requests on the detector systems are very demanding: very large instrumented surface, radiation hardness and high reliability. During the conference a large part of the talks will be devoted to describe the pixel and microstrip silicon-based detectors operated in the LHC experiments (Alice, Atlas, CMS, LHCb). The operational experience and the detector performance with the p-p runs 2010-2011 will be discussed. A fraction of the talks will describe possible LHC luminosity upgrade (HL-LHC) and recent developments on detector radiation hardness. The astroparticle detectors activity will also be reviewed. Topics related to the development and applications of detector electronics will be presented too. Finally semiconductor applications in different fields, like medical Dosimetry and Photomultipliers will be rapidly touched.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
publisher SISSA
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spelling cern-13412432021-07-30T13:13:12Zhttp://cds.cern.ch/record/1341243engCollective10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor DetectorsDetectors and Experimental TechniquesThe primary goal of the Conference is to review the present status of the Semiconductor Detector apparatuses in the field of High Energy or Astroparticle Physics. In both cases the requests on the detector systems are very demanding: very large instrumented surface, radiation hardness and high reliability. During the conference a large part of the talks will be devoted to describe the pixel and microstrip silicon-based detectors operated in the LHC experiments (Alice, Atlas, CMS, LHCb). The operational experience and the detector performance with the p-p runs 2010-2011 will be discussed. A fraction of the talks will describe possible LHC luminosity upgrade (HL-LHC) and recent developments on detector radiation hardness. The astroparticle detectors activity will also be reviewed. Topics related to the development and applications of detector electronics will be presented too. Finally semiconductor applications in different fields, like medical Dosimetry and Photomultipliers will be rapidly touched.SISSAoai:cds.cern.ch:13412432011
spellingShingle Detectors and Experimental Techniques
Collective
10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title_full 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title_fullStr 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title_full_unstemmed 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title_short 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
title_sort 10th international conference on large scale applications and radiation hardness of semiconductor detectors
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1341243
work_keys_str_mv AT collective 10thinternationalconferenceonlargescaleapplicationsandradiationhardnessofsemiconductordetectors