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Front end electronics for silicon strip detectors in 90-nm CMOS technology: Advantages and challenges

Detalles Bibliográficos
Autores principales:	Kaplon, J, Noy, M
Publicado:	2010
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1088/1748-0221/5/11/C11024 http://cds.cern.ch/record/1352698

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