Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors

Measurements are shown of GeV pions and muons in two 300 mu m thick, Si Medipix pixel detector assemblies that are stacked on top of each other, with a 25 mu m thick brass foil in between. In such a radiation imaging semiconductor matrix with a large number of pixels along the particle trail, one ca...

Descripción completa

Detalles Bibliográficos
Autores principales: Heijne, E H M, Tlustos, L, Wong, W, Idarraga, J, Visser, J, Jakubek, J, Leroy, C, Turecek, D, Visschers, J, Pospisil, S, Ballabriga, R, Vykydal, Z, Vermeulen, J, Plackett, R, Llopart, X, Boltje, D, Campbell, M
Lenguaje:eng
Publicado: 2010
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/5/06/C06004
http://cds.cern.ch/record/1359325

Ejemplares similares

Ejemplares similares