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Development of a Test Environment for the Characterization of the Current Digitizer Chip DCD2 and the DEPFET Pixel System for the Belle II Experiment at SuperKEKB
The future super flavor factory SuperKEKB with its detector system Belle II offers precision physics measurements to verify the Standard Model or probe undiscovered phenomena beyond its limits. A two layer vertex pixel detector is built based on the DEPFET technology. The Depleted Field Effect Tran...
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| Lenguaje: | eng |
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2011
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| Acceso en línea: | http://cds.cern.ch/record/1380639 |