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New developments in Micromegas Microbulk detectors
A new Micromegas manufacturing technique, based on kapton etching technology, has been recently developed, improving the uniformity and stability of this kind of readouts. Excellent energy resolutions have been obtained, reaching 11% FWHM for the 5.9 keV photon peak of 55Fe source and 1.8% FWHM for...
Autores principales: | , , , , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2011
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.phpro.2012.02.392 http://cds.cern.ch/record/1390053 |