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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials
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| Lenguaje: | eng |
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Springer
1984
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| Acceso en línea: | https://dx.doi.org/10.1007/BFb0025745 http://cds.cern.ch/record/1391261 |
| Descripción no disponible. |