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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials

Detalles Bibliográficos
Autor principal:	Waseda, Yoshio
Lenguaje:	eng
Publicado:	Springer 1984
Materias:	Chemical Physics and Chemistry
Acceso en línea:	https://dx.doi.org/10.1007/BFb0025745 http://cds.cern.ch/record/1391261

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