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Use of IV (current vs voltage) scans to track radiation damage in the LHCb VELO

This note describes the results of a study of radiation damage to the 88 silicon sensors of the VELO, using as input data the regular current vs voltage scans (IV scans). The current measured in the sensors can be broadly described as consisting of two components, bulk current and surface current, w...

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Detalles Bibliográficos
Autores principales: Gureja, Ankit, Akiba, Kazuyoshi, van Beuzekom, Martin, Borghi, Silvia, Brown, Henry, John, Malcolm, Latham, Thomas, Leflat, Alexander, Parkes, Chris, Patel, Girish, Rakotomiaramanana, Barinjaka, Redford, Sophie, Reid, Matthew, Rodrigues, Eduardo, Webber, Adam
Lenguaje:eng
Publicado: 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1392352

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