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Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands

A quantitative knowledge of inter-filament transverse resistance will allow us to describe current redistribution processes inside strands more accurately. This is particularly important for the analysis of the influence of strain and crack distribution patterns in Nb(3)Sn filaments on the shape of...

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Detalles Bibliográficos
Autores principales: Zhou, C, Nijhuis, A, Veldhuis, D, van Lanen, E P A, ten Kate, H H J, Dhalle, M
Lenguaje:eng
Publicado: 2011
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1109/TASC.2010.2083619
http://cds.cern.ch/record/1399776
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author Zhou, C
Nijhuis, A
Veldhuis, D
van Lanen, E P A
ten Kate, H H J
Dhalle, M
author_facet Zhou, C
Nijhuis, A
Veldhuis, D
van Lanen, E P A
ten Kate, H H J
Dhalle, M
author_sort Zhou, C
collection CERN
description A quantitative knowledge of inter-filament transverse resistance will allow us to describe current redistribution processes inside strands more accurately. This is particularly important for the analysis of the influence of strain and crack distribution patterns in Nb(3)Sn filaments on the shape of the voltage-current curves. Several indirect methods are commonly used to assess inter-filament resistance. Here we use a direct method to measure transverse inter-filament resistance and filament-to-matrix contact resistance. Two four-probe voltage-current methods are developed for measurements below 10 K at various background magnetic fields. In addition to FEM (Finite Element Method) simulation, also a new 3D strand model is developed to simulate the current-and voltage distributions. The experimental methods, first results as well as the simulations using the FEM method and new 3D strand model are described.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
record_format invenio
spelling cern-13997762019-09-30T06:29:59Zdoi:10.1109/TASC.2010.2083619http://cds.cern.ch/record/1399776engZhou, CNijhuis, AVeldhuis, Dvan Lanen, E P Aten Kate, H H JDhalle, MDirect Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn StrandsXXXXA quantitative knowledge of inter-filament transverse resistance will allow us to describe current redistribution processes inside strands more accurately. This is particularly important for the analysis of the influence of strain and crack distribution patterns in Nb(3)Sn filaments on the shape of the voltage-current curves. Several indirect methods are commonly used to assess inter-filament resistance. Here we use a direct method to measure transverse inter-filament resistance and filament-to-matrix contact resistance. Two four-probe voltage-current methods are developed for measurements below 10 K at various background magnetic fields. In addition to FEM (Finite Element Method) simulation, also a new 3D strand model is developed to simulate the current-and voltage distributions. The experimental methods, first results as well as the simulations using the FEM method and new 3D strand model are described.oai:cds.cern.ch:13997762011
spellingShingle XX
XX
Zhou, C
Nijhuis, A
Veldhuis, D
van Lanen, E P A
ten Kate, H H J
Dhalle, M
Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title_full Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title_fullStr Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title_full_unstemmed Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title_short Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and Nb(3)Sn Strands
title_sort direct measurement of inter-filament resistance in superconducting multifilamentary nbti and nb(3)sn strands
topic XX
XX
url https://dx.doi.org/10.1109/TASC.2010.2083619
http://cds.cern.ch/record/1399776
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