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Failure analysis: a practical guide for manufacturers of electronic components and systems
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, device...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Wiley
2011
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1420130 |
_version_ | 1780924142409744384 |
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author | Bâzu, Marius Bajenescu, Titu |
author_facet | Bâzu, Marius Bajenescu, Titu |
author_sort | Bâzu, Marius |
collection | CERN |
description | Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers nee |
id | cern-1420130 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2011 |
publisher | Wiley |
record_format | invenio |
spelling | cern-14201302021-04-22T00:37:28Zhttp://cds.cern.ch/record/1420130engBâzu, MariusBajenescu, TituFailure analysis: a practical guide for manufacturers of electronic components and systemsEngineeringFailure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers neeWileyoai:cds.cern.ch:14201302011 |
spellingShingle | Engineering Bâzu, Marius Bajenescu, Titu Failure analysis: a practical guide for manufacturers of electronic components and systems |
title | Failure analysis: a practical guide for manufacturers of electronic components and systems |
title_full | Failure analysis: a practical guide for manufacturers of electronic components and systems |
title_fullStr | Failure analysis: a practical guide for manufacturers of electronic components and systems |
title_full_unstemmed | Failure analysis: a practical guide for manufacturers of electronic components and systems |
title_short | Failure analysis: a practical guide for manufacturers of electronic components and systems |
title_sort | failure analysis: a practical guide for manufacturers of electronic components and systems |
topic | Engineering |
url | http://cds.cern.ch/record/1420130 |
work_keys_str_mv | AT bazumarius failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems AT bajenescutitu failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems |