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Failure analysis: a practical guide for manufacturers of electronic components and systems

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, device...

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Detalles Bibliográficos
Autores principales: Bâzu, Marius, Bajenescu, Titu
Lenguaje:eng
Publicado: Wiley 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1420130
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author Bâzu, Marius
Bajenescu, Titu
author_facet Bâzu, Marius
Bajenescu, Titu
author_sort Bâzu, Marius
collection CERN
description Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers nee
id cern-1420130
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
publisher Wiley
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spelling cern-14201302021-04-22T00:37:28Zhttp://cds.cern.ch/record/1420130engBâzu, MariusBajenescu, TituFailure analysis: a practical guide for manufacturers of electronic components and systemsEngineeringFailure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers neeWileyoai:cds.cern.ch:14201302011
spellingShingle Engineering
Bâzu, Marius
Bajenescu, Titu
Failure analysis: a practical guide for manufacturers of electronic components and systems
title Failure analysis: a practical guide for manufacturers of electronic components and systems
title_full Failure analysis: a practical guide for manufacturers of electronic components and systems
title_fullStr Failure analysis: a practical guide for manufacturers of electronic components and systems
title_full_unstemmed Failure analysis: a practical guide for manufacturers of electronic components and systems
title_short Failure analysis: a practical guide for manufacturers of electronic components and systems
title_sort failure analysis: a practical guide for manufacturers of electronic components and systems
topic Engineering
url http://cds.cern.ch/record/1420130
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AT bajenescutitu failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems