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Ionizing radiation effects in MOS oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer...
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| Lenguaje: | eng |
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World Scientific
1999
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| Acceso en línea: | http://cds.cern.ch/record/1425419 |