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Life-cycle assessment of semiconductors

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information te...

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Detalles Bibliográficos
Autores principales: Boyd, Sarah B, Horvath, Arpad
Lenguaje:eng
Publicado: Springer 2012
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-1-4419-9988-7
http://cds.cern.ch/record/1432937
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author Boyd, Sarah B
Horvath, Arpad
author_facet Boyd, Sarah B
Horvath, Arpad
author_sort Boyd, Sarah B
collection CERN
description Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions. The book also: Provides a detailed, complete and transparent life cycle assessment of semiconductor logic and memory devices Offers thorough evaluations of many technology generations of semiconductor logic and memory Contains an overview of environmentally significant trends in the semiconductor industry Life-Cycle Assessment of Semiconductors is an ideal book for researchers and engineers interested in the environmental impact of semiconductor manufacturing.
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spelling cern-14329372021-04-22T00:36:24Zdoi:10.1007/978-1-4419-9988-7http://cds.cern.ch/record/1432937engBoyd, Sarah BHorvath, ArpadLife-cycle assessment of semiconductorsEngineeringLife-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions. The book also: Provides a detailed, complete and transparent life cycle assessment of semiconductor logic and memory devices Offers thorough evaluations of many technology generations of semiconductor logic and memory Contains an overview of environmentally significant trends in the semiconductor industry Life-Cycle Assessment of Semiconductors is an ideal book for researchers and engineers interested in the environmental impact of semiconductor manufacturing.Springeroai:cds.cern.ch:14329372012
spellingShingle Engineering
Boyd, Sarah B
Horvath, Arpad
Life-cycle assessment of semiconductors
title Life-cycle assessment of semiconductors
title_full Life-cycle assessment of semiconductors
title_fullStr Life-cycle assessment of semiconductors
title_full_unstemmed Life-cycle assessment of semiconductors
title_short Life-cycle assessment of semiconductors
title_sort life-cycle assessment of semiconductors
topic Engineering
url https://dx.doi.org/10.1007/978-1-4419-9988-7
http://cds.cern.ch/record/1432937
work_keys_str_mv AT boydsarahb lifecycleassessmentofsemiconductors
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