Model-based testing for embedded systems

What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic wit...

Descripción completa

Detalles Bibliográficos
Autores principales: Zander, Justyna, Schieferdecker, Ina, Mosterman, Pieter J
Lenguaje:eng
Publicado: CRC Press 2011
Materias:
Computing and Computers
Acceso en línea:http://cds.cern.ch/record/1438596
_version_ 1780924629055963136
author Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J
author_facet Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J
author_sort Zander, Justyna
collection CERN
description What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used
id cern-1438596
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
publisher CRC Press
record_format invenio
spelling cern-14385962021-04-22T00:29:24Zhttp://cds.cern.ch/record/1438596engZander, JustynaSchieferdecker, InaMosterman, Pieter JModel-based testing for embedded systemsComputing and ComputersWhat the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-usedCRC Pressoai:cds.cern.ch:14385962011
spellingShingle Computing and Computers
Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J
Model-based testing for embedded systems
title Model-based testing for embedded systems
title_full Model-based testing for embedded systems
title_fullStr Model-based testing for embedded systems
title_full_unstemmed Model-based testing for embedded systems
title_short Model-based testing for embedded systems
title_sort model-based testing for embedded systems
topic Computing and Computers
url http://cds.cern.ch/record/1438596
work_keys_str_mv AT zanderjustyna modelbasedtestingforembeddedsystems
AT schieferdeckerina modelbasedtestingforembeddedsystems
AT mostermanpieterj modelbasedtestingforembeddedsystems

Ejemplares similares