Losses in superconducting Niobium Films caused by Interface Tunnel Exchange

Identifying the loss mechanisms of niobium film cavities enables an accurate determination of applications for future accelerator projects and points to research topics required to mitigate their limitations. Measurements on samples show that the electric field is a dominant loss mechanism for niobi...

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Detalles Bibliográficos
Autores principales: Junginger, Tobias, Weingarten, Wolfgang, Welsch, Carsten
Lenguaje:eng
Publicado: 2012
Materias:
Accelerators and Storage Rings
Acceso en línea:http://cds.cern.ch/record/1440145
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author Junginger, Tobias
Weingarten, Wolfgang
Welsch, Carsten
author_facet Junginger, Tobias
Weingarten, Wolfgang
Welsch, Carsten
author_sort Junginger, Tobias
collection CERN
description Identifying the loss mechanisms of niobium film cavities enables an accurate determination of applications for future accelerator projects and points to research topics required to mitigate their limitations. Measurements on samples show that the electric field is a dominant loss mechanism for niobium films, acting through interface tunneling between localized states in surface oxides and delocalized states in the superconducting niobium.
id cern-1440145
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2012
record_format invenio
spelling cern-14401452019-09-30T06:29:59Zhttp://cds.cern.ch/record/1440145engJunginger, TobiasWeingarten, WolfgangWelsch, CarstenLosses in superconducting Niobium Films caused by Interface Tunnel ExchangeAccelerators and Storage RingsIdentifying the loss mechanisms of niobium film cavities enables an accurate determination of applications for future accelerator projects and points to research topics required to mitigate their limitations. Measurements on samples show that the electric field is a dominant loss mechanism for niobium films, acting through interface tunneling between localized states in surface oxides and delocalized states in the superconducting niobium.arXiv:1204.2166oai:cds.cern.ch:14401452012-04-11
spellingShingle Accelerators and Storage Rings
Junginger, Tobias
Weingarten, Wolfgang
Welsch, Carsten
Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title_full Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title_fullStr Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title_full_unstemmed Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title_short Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
title_sort losses in superconducting niobium films caused by interface tunnel exchange
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/1440145
work_keys_str_mv AT jungingertobias lossesinsuperconductingniobiumfilmscausedbyinterfacetunnelexchange
AT weingartenwolfgang lossesinsuperconductingniobiumfilmscausedbyinterfacetunnelexchange
AT welschcarsten lossesinsuperconductingniobiumfilmscausedbyinterfacetunnelexchange

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