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Losses in superconducting Niobium Films caused by Interface Tunnel Exchange
Identifying the loss mechanisms of niobium film cavities enables an accurate determination of applications for future accelerator projects and points to research topics required to mitigate their limitations. Measurements on samples show that the electric field is a dominant loss mechanism for niobi...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2012
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1440145 |