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A pixel detector asic for dosimetry using time-over-threshold energy measurements

In this work we present the design of a chip which provides the readout of a highly segmented diode array, in which signals induced by individual X-ray photons are processed discretely. There are several benefits to this approach, including the ability to achieve a high signal to noise ratio due to...

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Detalles Bibliográficos
Autores principales: Wong, W S, Anton, G, Ballabriga, R, Bohnel, M, Campbell, M, Heijne, E, Llopart, X, Michel, T, Munster, I, Plackett, R, Sievers, P, Takoukam, P, Tlustos, L, Valerio, P
Publicado: 2011
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.radmeas.2011.06.061
http://cds.cern.ch/record/1447124
Descripción
Sumario:In this work we present the design of a chip which provides the readout of a highly segmented diode array, in which signals induced by individual X-ray photons are processed discretely. There are several benefits to this approach, including the ability to achieve a high signal to noise ratio due to the inherently low sensor capacitance, and the suppression of background noise (e.g. dark current) using an analogue threshold. The segmentation also ensures a linear behaviour even at very high dose rates. A time over threshold (ToT) energy measurement technique provides an immediate digital value corresponding to the energy deposited onto the diode by each individual photon. Deadtime-free operation is achieved by reading out a subset of the detector segments at a time while the rest of the detector continues to process signals. This paper describes the application-specific integrated circuit (ASIC) chip which was designed to provide pre-processing of photo-induced signals in the detector and readout of the processed digital data.