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Analysis of a copper sample for the CLIC ACS study in a field emission scanning microscope

We report measurements on a diamond turned Copper sample of material intended for the CLIC accelerating structures. The first part of the measurements was performed at Bergische Universität Wuppertal using a field emission scanning microscope to localize and characterize strong emission sites. In a...

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Detalles Bibliográficos
Autores principales: Muranaka, Tomoko, Blom, Tobias, Leifer, Klaus, Ziemann, Volker, Navitski, Aliaksandr, Müller, Günter
Lenguaje:eng
Publicado: 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1448252
Descripción
Sumario:We report measurements on a diamond turned Copper sample of material intended for the CLIC accelerating structures. The first part of the measurements was performed at Bergische Universität Wuppertal using a field emission scanning microscope to localize and characterize strong emission sites. In a second part the sample was investigated in an optical microscope, a white-light profilometer and scanning electron microscope in the microstructure laboratory in Uppsala to attempt to identify the features responsible for the field emission.