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Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter

The expected increase of total integrated luminosity by a factor ten at the sLHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic Endcap Calorimeter (HEC). New more radiation hard techno...

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Autor principal: Nagel, M
Lenguaje:eng
Publicado: 2012
Materias:
Acceso en línea:http://cds.cern.ch/record/1455268
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author Nagel, M
author_facet Nagel, M
author_sort Nagel, M
collection CERN
description The expected increase of total integrated luminosity by a factor ten at the sLHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic Endcap Calorimeter (HEC). New more radiation hard technologies have been studied: SiGe bipolar, Si CMOS FET and GaAs FET transistors have been irradiated with neutrons up to an integrated fluence of 2.2 x 10^16 neutrons/cm^2 and with 200 MeV protons up to an integrated fluence of 3.4 x 10^14 protons/cm^2. Comparisons of transistor parameters such as the gain for both types of irradiations are presented.
id cern-1455268
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2012
record_format invenio
spelling cern-14552682019-09-30T06:29:59Zhttp://cds.cern.ch/record/1455268engNagel, MNeutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap CalorimeterDetectors and Experimental TechniquesThe expected increase of total integrated luminosity by a factor ten at the sLHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic Endcap Calorimeter (HEC). New more radiation hard technologies have been studied: SiGe bipolar, Si CMOS FET and GaAs FET transistors have been irradiated with neutrons up to an integrated fluence of 2.2 x 10^16 neutrons/cm^2 and with 200 MeV protons up to an integrated fluence of 3.4 x 10^14 protons/cm^2. Comparisons of transistor parameters such as the gain for both types of irradiations are presented.ATL-LARG-SLIDE-2012-370oai:cds.cern.ch:14552682012-06-11
spellingShingle Detectors and Experimental Techniques
Nagel, M
Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title_full Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title_fullStr Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title_full_unstemmed Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title_short Neutron and Proton Tests of Different Technologies for the Upgrade of Cold Readout Electronics of the ATLAS Hadronic Endcap Calorimeter
title_sort neutron and proton tests of different technologies for the upgrade of cold readout electronics of the atlas hadronic endcap calorimeter
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1455268
work_keys_str_mv AT nagelm neutronandprotontestsofdifferenttechnologiesfortheupgradeofcoldreadoutelectronicsoftheatlashadronicendcapcalorimeter