Front-end electronics for multichannel semiconductor detector systems

Front-end electronics for multichannel semiconductor detektor systems Volume 08, EuCARD Editorial Series on Accelerator Science and Technology The monograph is devoted to many different aspects related to front-end electronics for semiconductor detector systems, namely: − designing and testing silicon position sensitive detectors for HEP experiments and X-ray imaging applications, − designing and testing of multichannel readout electronics for semiconductor detectors used in X-ray imaging applications, especially for noise minimization, fast signal processing, crosstalk reduction and good matching performance, − optimization of semiconductor detection systems in respect to the effects of radiation damage. The monograph is the result mainly of the author's experience in the above-mentioned areas and it is an attempt of a comprehensive presentation of issues related to the position sensitive detection system working in a single photon counting mode and intended to X-ray imaging applications. The structure of this book is as follows: - semiconductor detectors: detector materials, signal generation, detector segmentation, detector models; - architecture of front end electronics: CSA, shaper, discriminator, noise optimizations, pulse shaping, fast signal processing; - important aspects of multichannel integrated circuits: noise modeling, short channel effects, digital to analog crosstalk, random matching; - radiation damage of integrated circuits: total dose effects, single event effects, radiation tolerant design; - examples of multichannel counting integrated circuits: chips for strip detectors, solutions for pad and pixel detectors.