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Semiconductor memories: technology testing and reliability
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Wiley-IEEE Press
1997
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1480885 |
| _version_ | 1780925910301540352 |
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| author | Sharma, Ashok K |
| author_facet | Sharma, Ashok K |
| author_sort | Sharma, Ashok K |
| collection | CERN |
| id | cern-1480885 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| publisher | Wiley-IEEE Press |
| record_format | invenio |
| spelling | cern-14808852021-04-22T00:22:32Zhttp://cds.cern.ch/record/1480885engSharma, Ashok KSemiconductor memories: technology testing and reliabilityEngineeringWiley-IEEE Pressoai:cds.cern.ch:14808851997 |
| spellingShingle | Engineering Sharma, Ashok K Semiconductor memories: technology testing and reliability |
| title | Semiconductor memories: technology testing and reliability |
| title_full | Semiconductor memories: technology testing and reliability |
| title_fullStr | Semiconductor memories: technology testing and reliability |
| title_full_unstemmed | Semiconductor memories: technology testing and reliability |
| title_short | Semiconductor memories: technology testing and reliability |
| title_sort | semiconductor memories: technology testing and reliability |
| topic | Engineering |
| url | http://cds.cern.ch/record/1480885 |
| work_keys_str_mv | AT sharmaashokk semiconductormemoriestechnologytestingandreliability |