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Image processing and pattern recognition: fundamentals and techniques
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Wiley-IEEE Press
2010
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1481001 |
| _version_ | 1780925934507917312 |
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| author | Shih, Frank Y |
| author_facet | Shih, Frank Y |
| author_sort | Shih, Frank Y |
| collection | CERN |
| id | cern-1481001 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2010 |
| publisher | Wiley-IEEE Press |
| record_format | invenio |
| spelling | cern-14810012021-04-22T00:21:30Zhttp://cds.cern.ch/record/1481001engShih, Frank YImage processing and pattern recognition: fundamentals and techniquesEngineeringWiley-IEEE Pressoai:cds.cern.ch:14810012010 |
| spellingShingle | Engineering Shih, Frank Y Image processing and pattern recognition: fundamentals and techniques |
| title | Image processing and pattern recognition: fundamentals and techniques |
| title_full | Image processing and pattern recognition: fundamentals and techniques |
| title_fullStr | Image processing and pattern recognition: fundamentals and techniques |
| title_full_unstemmed | Image processing and pattern recognition: fundamentals and techniques |
| title_short | Image processing and pattern recognition: fundamentals and techniques |
| title_sort | image processing and pattern recognition: fundamentals and techniques |
| topic | Engineering |
| url | http://cds.cern.ch/record/1481001 |
| work_keys_str_mv | AT shihfranky imageprocessingandpatternrecognitionfundamentalsandtechniques |