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Effects of radiation on MOS structures and silicon devices

Detalles Bibliográficos
Autores principales: Bräunig, D, Fahrner, W R
Lenguaje:eng
Publicado: Hahn-Meitner-Inst. Kernforsch. 1983
Materias:
Acceso en línea:http://cds.cern.ch/record/148433
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author Bräunig, D
Fahrner, W R
author_facet Bräunig, D
Fahrner, W R
author_sort Bräunig, D
collection CERN
id cern-148433
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1983
publisher Hahn-Meitner-Inst. Kernforsch.
record_format invenio
spelling cern-1484332019-09-30T06:29:59Zhttp://cds.cern.ch/record/148433engBräunig, DFahrner, W REffects of radiation on MOS structures and silicon devicesEngineeringHahn-Meitner-Inst. Kernforsch.HMI-B-399oai:cds.cern.ch:1484331983
spellingShingle Engineering
Bräunig, D
Fahrner, W R
Effects of radiation on MOS structures and silicon devices
title Effects of radiation on MOS structures and silicon devices
title_full Effects of radiation on MOS structures and silicon devices
title_fullStr Effects of radiation on MOS structures and silicon devices
title_full_unstemmed Effects of radiation on MOS structures and silicon devices
title_short Effects of radiation on MOS structures and silicon devices
title_sort effects of radiation on mos structures and silicon devices
topic Engineering
url http://cds.cern.ch/record/148433
work_keys_str_mv AT braunigd effectsofradiationonmosstructuresandsilicondevices
AT fahrnerwr effectsofradiationonmosstructuresandsilicondevices