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Effects of radiation on MOS structures and silicon devices

Detalles Bibliográficos
Autores principales:	Bräunig, D, Fahrner, W R
Lenguaje:	eng
Publicado:	Hahn-Meitner-Inst. Kernforsch. 1983
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/148433

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